Now showing items 111-130 of 427
Subject |
---|
nanoindentation [1] |
network [1] |
neutron diffraction [1] |
nickel [1] |
noise [1] |
non-destructive testing [5] |
nondestructive testing [1] |
nondestructive testing and evaluation [1] |
optical characteristics of indium sulfide [1] |
optical diagnostics [1] |
optical-electronic converter [1] |
PA [1] |
parameter [1] |
parameter testing of thin-film structure [1] |
phase composition [1] |
photoelastic stress measurement [1] |
photoelectric converter [1] |
pipeline [2] |
pneumatic sensor [2] |
polarimetry [1] |
Now showing items 111-130 of 427