Now showing items 155-174 of 427
Subject |
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sampling error [1] |
scanning [1] |
scattering field [1] |
sensitivity [1] |
signal [1] |
signal level [1] |
software simulator [1] |
solution [1] |
spectral ellipsometry [1] |
spectrophotometry [1] |
standard sample [1] |
Stoletov curve [1] |
strain state of a material [1] |
stress [1] |
stress-corrosion cracks [1] |
surface defects [1] |
switching characteristics [1] |
synthetic film [1] |
technical saturation magnetization [1] |
technological process [1] |
Now showing items 155-174 of 427