Interface effect on the nonlinear optical properties of thin films

dc.contributor.author	Khomchenko, A. V.
dc.contributor.author	Хомченко, А. В.
dc.contributor.author	Glasunov, E. V.
dc.contributor.author	Глазунов, Е. В.
dc.date.accessioned	2020-01-29T07:45:49Z
dc.date.available	2020-01-29T07:45:49Z
dc.date.issued	2002
dc.identifier.citation	Khomchenko, A. V. Interface effect on the nonlinear optical properties of thin films / A. V. Khomchenko, Е. V. Glasunov // Optical and Quantum Electronics. - 2002. - Vol.34, №4. - P. 359-368.	ru_RU
dc.identifier.uri	http://e.biblio.bru.by/handle/1212121212/11350
dc.description.abstract	The optical nonlinearity of low-dimension structures is studied in the self-effect case at a wavelength of 630 nm in a range of light intensities below 0.1 W/cm2 by waveguide methods. Common tendencies in relationships between intensity of light and optical properties of multilayer structures and semiconductor-doped glass films are detected. It is shown that the state of interfaces determines the character of optical nonlinearity.	ru_RU
dc.language.iso	en	ru_RU
dc.subject	Публикации кафедры "Физика"	ru_RU
dc.title	Interface effect on the nonlinear optical properties of thin films	ru_RU
dc.type	Article	ru_RU

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