Interface effect on the nonlinear optical properties of thin films

Show simple item record

dc.contributor.author Khomchenko, A. V.
dc.contributor.author Хомченко, А. В.
dc.contributor.author Glasunov, E. V.
dc.contributor.author Глазунов, Е. В.
dc.date.accessioned 2020-01-29T07:45:49Z
dc.date.available 2020-01-29T07:45:49Z
dc.date.issued 2002
dc.identifier.citation Khomchenko, A. V. Interface effect on the nonlinear optical properties of thin films / A. V. Khomchenko, Е. V. Glasunov // Optical and Quantum Electronics. - 2002. - Vol.34, №4. - P. 359-368. ru_RU
dc.identifier.uri http://e.biblio.bru.by/handle/1212121212/11350
dc.description.abstract The optical nonlinearity of low-dimension structures is studied in the self-effect case at a wavelength of 630 nm in a range of light intensities below 0.1 W/cm2 by waveguide methods. Common tendencies in relationships between intensity of light and optical properties of multilayer structures and semiconductor-doped glass films are detected. It is shown that the state of interfaces determines the character of optical nonlinearity. ru_RU
dc.language.iso en ru_RU
dc.subject Публикации кафедры "Физика" ru_RU
dc.title Interface effect on the nonlinear optical properties of thin films ru_RU
dc.type Article ru_RU


Files in this item

This item appears in the following Collection(s)

Show simple item record

Search DSpace


Browse

My Account