Abstract:
The optical nonlinearity of low-dimension structures is studied in the self-effect case at a
wavelength of 630 nm in a range of light intensities below 0.1 W/cm2 by waveguide methods. Common
tendencies in relationships between intensity of light and optical properties of multilayer structures and
semiconductor-doped glass films are detected. It is shown that the state of interfaces determines the
character of optical nonlinearity.
